Govoreanu, BogdanBogdanGovoreanuAjaykumar, ArjunArjunAjaykumarLipowicz, HubertHubertLipowiczChen, YangyinYangyinChenLiu, Jen-ChiehJen-ChiehLiuDegraeve, RobinRobinDegraeveZhang, LeqiLeqiZhangClima, SergiuSergiuClimaGoux, LudovicLudovicGouxRadu, IulianaIulianaRaduFantini, AndreaAndreaFantiniRaghavan, NagaNagaRaghavanKar, Gouri SankarGouri SankarKarKim, WoosikWoosikKimRedolfi, AugustoAugustoRedolfiWouters, DirkDirkWoutersAltimime, LaithLaithAltimimeJurczak, GosiaGosiaJurczak2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22423Performance and reliability of ultra-thin HfO2-based RRAM (UTO-RRAM)Proceedings paper