Kaczer, BenBenKaczerDegraeve, RobinRobinDegraeveDe Keersgieter, AnAnDe KeersgieterVan de Mieroop, KoenKoenVan de MieroopBearda, TwanTwanBeardaGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5387Consistent model for short-channel nMOSFET post-hard-breakdown characteristicsProceedings paper