A quantitative inquisition into ESD sensitivity to strain in nanoscale CMOS protection devices

Sarkar, DeblinaDeblinaSarkarThijs, StevenStevenThijsLinten, DimitriDimitriLintenRuss, ChristianChristianRussGossner, HaraldHaraldGossnerBanerjee, KaustavKaustavBanerjee2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17944A quantitative inquisition into ESD sensitivity to strain in nanoscale CMOS protection devicesProceedings paper