Wu, Ming FangMing FangWuVantomme, AndreAndreVantommeHogg, S. M.S. M.HoggLangouche, G.G.LangoucheVan der Stricht, WimWimVan der StrichtJacobs, KoenKoenJacobsMoerman, IngridIngridMoerman2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/4037Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling studyJournal article