van Wees, B. J.B. J.van WeesMeijer, G. I.G. I.MeijerKuipers, J. J.J. J.KuipersKlapwijk, T. M.T. M.KlapwijkVan de Graaf, WillemWillemVan de GraafBorghs, GustaafGustaafBorghs2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/955Breakdown of the quantum Hall effect in InAs/AlSb quantum wells due to counterflowing edge channelsJournal article