Hantschel, ThomasThomasHantschelCott, DaireDaireCottPalanne, SakuSakuPalanneRichard, OlivierOlivierRichardArstila, KaiKaiArstilaVerhulst, AnneAnneVerhulstSchulz, VolkerVolkerSchulzEyben, PierrePierreEybenVandervorst, WilfriedWilfriedVandervorst2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13836Development of methodologies for characterizing individual carbon nanotubes and silicon nanowires for use in nanoelectronics technologyOral presentation