Wu, LizhouLizhouWuRao, SiddharthSiddharthRaoCardoso Medeiros, GuilhermeGuilhermeCardoso MedeirosTaouil, MottaqiallahMottaqiallahTaouilMarinissen, Erik JanErik JanMarinissenYasin, FarrukhFarrukhYasinCouet, SebastienSebastienCouetHamdioui, SaidSaidHamdiouiKar, Gouri SankarGouri SankarKar2021-10-272021-10-272019-05https://imec-publications.be/handle/20.500.12860/34457Pinhole defect characterization and modeling for STT-MRAM testingProceedings paper