Application of FFT-scanning spreading resistance microscopy to the analysis of poly-silicon solar-cells

Eyben, PierrePierreEybenBisiaux, PierrePierreBisiauxSchulze, AndreasAndreasSchulzeVandervorst, WilfriedWilfriedVandervorst2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23796Application of FFT-scanning spreading resistance microscopy to the analysis of poly-silicon solar-cellsOral presentation