Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias space

Bury, ErikErikBuryVaisman Chasin, AdrianAdrianVaisman ChasinChuang, KentKentChuangVandemaele, MichielMichielVandemaeleVan Beek, SimonSimonVan BeekFranco, JacopoJacopoFrancoKaczer, BenBenKaczerLinten, DimitriDimitriLinten2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32623Array-based statistical characterization of CMOS degradation modes and modeling of the time-dependent variability induced by different stress patterns in the {VG,VD} bias spaceProceedings paperhttps://ieeexplore.ieee.org/document/8720592