Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs

Griffoni, AlessioAlessioGriffoniThijs, StevenStevenThijsRuss, ChristianChristianRussTremouilles, DavidDavidTremouillesLinten, DimitriDimitriLintenScholz, MirkoMirkoScholzSimoen, EddyEddySimoenClaeys, CorCorClaeysMeneghesso, GaudenzioGaudenzioMeneghessoGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-1820101530-4388https://imec-publications.be/handle/20.500.12860/17191Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETsJournal articlehttp://ieeexplore.ieee.org/search/srchabstract.jsp?tp=&arnumber=5339158&queryText%3Dgriffoni%26openedRefinements%3D*%26searchFie