Beckers, ArnoutArnoutBeckersJaezeri, FarzanFarzanJaezeriGrill, AlexanderAlexanderGrillNarasimhamoorthy, SubramanianSubramanianNarasimhamoorthyParvais, BertrandBertrandParvaisEnz, ChristianChristianEnz2021-10-282021-10-2820202168-6734https://imec-publications.be/handle/20.500.12860/34720Physical model of low-temperature to cryogenic threshold voltage in MOSFETsJournal articlehttps://ieeexplore.ieee.org/document/9076206