Sikula, J.J.SikulaHruska, P.P.HruskaVasina, PetrPetrVasinaClaeys, C.C.ClaeysSimoen, EddyEddySimoenStadalnikas, A.A.Stadalnikas2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1477RTS noise in submicron MOSFETsOral presentation