Quantitive endurance failure model for filamentary RRAM

Degraeve, RobinRobinDegraeveFantini, AndreaAndreaFantiniRoussel, PhilippePhilippeRousselGoux, LudovicLudovicGouxCostantino, A.A.CostantinoChen, MichaelMichaelChenClima, SergiuSergiuClimaGovoreanu, BogdanBogdanGovoreanuLinten, DimitriDimitriLintenThean, AaronAaronTheanJurczak, GosiaGosiaJurczak2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25172Quantitive endurance failure model for filamentary RRAMProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7223673