Factors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes

Simoen, EddyEddySimoenClaeys, CorCorClaeysOhyama, HidenoriHidenoriOhyamaTakami, Y.Y.TakamiSunaga, H.H.Sunaga2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3831Factors determining the lifetime damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodesJournal article