In-situ plucker system for preparation of TEM samples by FIB: new applications, future prospects and challenges

Benedetti, AlessandroAlessandroBenedettiBender, HugoHugoBender2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7197In-situ plucker system for preparation of TEM samples by FIB: new applications, future prospects and challengesOral presentation