Exposure to RF-EMF hotspots induced by maximum ratio field combining in 5th generation networks

Velghe, MaartenMaartenVelgheShikhantsov, SergeiSergeiShikhantsovTanghe, EmmericEmmericTangheMartens, LucLucMartensJoseph, WoutWoutJosephThielens, ArnoArnoThielens2021-10-292021-10-292020-06https://imec-publications.be/handle/20.500.12860/36229Exposure to RF-EMF hotspots induced by maximum ratio field combining in 5th generation networksProceedings paper