Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies

Vassilev, VesselinVesselinVassilevLorenzini, MartinoMartinoLorenziniJansen, PhilippePhilippeJansenGroeseneken, GuidoGuidoGroesenekenThijs, StevenStevenThijsMahadeva Iyer, NatarajanNatarajanMahadeva IyerSteyaert, M.M.SteyaertMaes, HermanHermanMaes2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9842Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologiesProceedings paper