Schreurs, DominiqueDominiqueSchreursVandamme, EwoutEwoutVandammeVandenberghe, S.S.VandenbergheCarchon, GeertGeertCarchonNauwelaers, BartBartNauwelaers2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4734Verification of non-linear MOSFET models by intermodulation measurements under loadpull conditionsProceedings paper