Water-assisted positive ion contamination resulting in charge loss in nonvolatile memories

Gassot, P.P.GassotIline, A.A.Ilinede Backer, E.E.de BackerTack, MarnixMarnixTackWellekens, DirkDirkWellekensVan Houdt, JanJanVan HoudtHaspeslagh, LucLucHaspeslagh2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4383Water-assisted positive ion contamination resulting in charge loss in nonvolatile memoriesProceedings paper