A simple characterization method for MOS transistor matching in deep submicron technologies

Croon, JeroenJeroenCroonRosmeulen, MaartenMaartenRosmeulenDecoutere, StefaanStefaanDecoutereSansen, WillyWillySansenMaes, HermanHermanMaes2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5172A simple characterization method for MOS transistor matching in deep submicron technologiesProceedings paper