Xu, MingweiMingweiXuHantschel, ThomasThomasHantschelVandervorst, WilfriedWilfriedVandervorst2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5850Reliable 2-d carrier profiling with SSRM on InP-based devicesProceedings paper