Defect spectroscopy from electrical measurements: a simulation based technique

Larcher, LucaLucaLarcherPadovani, AndreaAndreaPadovaniPramanik, DipankarDipankarPramanikKaczer, BenBenKaczerPalumbo, FelixFelixPalumbo2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/31118Defect spectroscopy from electrical measurements: a simulation based techniqueProceedings paperhttps://ieeexplore.ieee.org/document/8421450