Embedded toggle generator to provide realistic test conditions during test of digital 2D-SoCs and 3D-SICs

Katselas, LeonidasLeonidasKatselasHatzopoulos, AlkisAlkisHatzopoulosJiao, HailongHailongJiaoPapameletis, ChristosChristosPapameletisMarinissen, Erik JanErik JanMarinissen2021-10-252021-10-252018-05https://imec-publications.be/handle/20.500.12860/31022Embedded toggle generator to provide realistic test conditions during test of digital 2D-SoCs and 3D-SICsProceedings paperhttps://www.cadence.com/content/cadence-www/global/en_US/home/cdnlive/emea-2018/proceedings.html