Baklanov, MikhaïlMikhaïlBaklanovDultsev, F. N.F. N.DultsevKondoh, EiichiEiichiKondohMogilnikov, K. P.K. P.MogilnikovMaex, KarenKarenMaexWang, SharonSharonWangForester, LynnLynnForester2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3207Development of a non-destructive thin film porosimetry: pore size distribution and pore volume of porous silicaProceedings paper