A full-automatic test system for characterizing wide-I/O micro-bump probe cards

Marinissen, Erik JanErik JanMarinissenFodor, FerencFerencFodorDe Wachter, BartBartDe WachterKiesewetter, JoergJoergKiesewetterHill, EricEricHillSmith, KenKenSmith2021-10-242021-10-242017-06https://imec-publications.be/handle/20.500.12860/28921A full-automatic test system for characterizing wide-I/O micro-bump probe cardsProceedings paperhttp://www.swtest.org/swtw_library/2017proc/swtw2017.html