Radiation source dependence of degradation and recovery of irradiated In0.53Ga0.47As PIN photodiodes

Ohyama, HidenoriHidenoriOhyamaSimoen, EddyEddySimoenClaeys, CorCorClaeysTakami, Y.Y.TakamiKudou, T.T.KudouSunaga, H.H.Sunaga2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2826Radiation source dependence of degradation and recovery of irradiated In0.53Ga0.47As PIN photodiodesProceedings paper