Extraction of the minority carrier recombination lifetime from forward diode characteristics

Vanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenClaeys, C.C.Claeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/976Extraction of the minority carrier recombination lifetime from forward diode characteristicsJournal article