Correlation between radiation induced defects and lifetime degradation in high energy particle exposed float-zone silicon diodes

Simoen, EddyEddySimoenClaeys, CorCorClaeysGaubas, EugenijusEugenijusGaubasOhyama, HidenoriHidenoriOhyama2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2948Correlation between radiation induced defects and lifetime degradation in high energy particle exposed float-zone silicon diodesMeeting abstract