Deterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stack

Degraeve, RobinRobinDegraeveGoux, LudovicLudovicGouxRoussel, PhilippePhilippeRousselWouters, DirkDirkWoutersKittl, JorgeJorgeKittlAltimime, LaithLaithAltimimeJurczak, GosiaGosiaJurczakGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/18819Deterministic and stochastic component in RESET transient of HfSiO/FUSI gate RRAM stackProceedings paper