Kaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueFranco, JacopoJacopoFrancoGrasser, TiborTiborGrasserRoussel, PhilippePhilippeRousselCamargo, V. V. A.V. V. A.CamargoMahato, S.S.MahatoSimoen, EddyEddySimoenCatthoor, FranckyFranckyCatthoorWirth, G. I.G. I.WirthGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20890Recent trends in CMOS reliability: from individual traps to circuit simulationsOral presentation