Hot-carrier phenomena in MOS field-effect transistors: analysis techniques, injection mechanisms and degradation models

Maes, H.Heremans, PaulPaulHeremans2026-06-152026-06-151990https://imec-publications.be/handle/20.500.12860/59711Hot-carrier phenomena in MOS field-effect transistors: analysis techniques, injection mechanisms and degradation modelsPHD thesis