Bronckers, StephaneStephaneBronckersVan der Plas, GeertGeertVan der PlasMarchal, PolPolMarchalRolain, YvesYvesRolain2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/15045Application of substrate noise simulation methodology to 3D-stackingOral presentation