Back-gate induced noise overshoot in partially-depleted SOI MOSFETs

Lukyanchikova, N.N.LukyanchikovaGarbar, N.N.GarbarSmolanka, A.A.SmolankaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10812Back-gate induced noise overshoot in partially-depleted SOI MOSFETsProceedings paper