Goux, LudovicLudovicGouxTio Castro, DavidDavidTio CastroHurkx, FredFredHurkxLisoni, JuditJuditLisoniDelhougne, RomainRomainDelhougneGravesteijn, DirkDirkGravesteijnAttenborough, KarenKarenAttenboroughWouters, DirkDirkWouters2021-10-172021-10-1720090018-9383https://imec-publications.be/handle/20.500.12860/15380Degradation of the reset switching during endurance testing of a phase-change line cellJournal article