Petersen, R.R.PetersenDe Ceuninck, WardWardDe CeuninckD'Haen, JanJanD'HaenD'Olieslaeger, MarcMarcD'OlieslaegerDe Schepper, LucLucDe SchepperVendier, O.O.VendierBlanck, H.H.BlanckPons, D.D.Pons2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6707Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technologyJournal article