Duan, MengMengDuanZhang, Jian FuJian FuZhangJi, ZhigangZhigangJiZhang, Wei DongWei DongZhangKaczer, BenBenKaczerAsenov, AsenAsenAsenov2021-10-242021-10-2420170018-9383https://imec-publications.be/handle/20.500.12860/28281Key issues and solutions for characterizing hot carrier aging of nanometer scale nMOSFETsJournal articlehttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7912321