Grasser, TiborTiborGrasserRott, K.K.RottReisinger, H.H.ReisingerWagner, P.J.P.J.WagnerGoes, WWGoesSchanovsky, F.F.SchanovskyWaltl, M.M.WaltlToledano Luque, MariaMariaToledano LuqueKaczer, BenBenKaczer2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22428Advanced characterization of oxide traps: the dynamic time-dependent defect spectroscopyProceedings paperhttp://dx.doi.org/10.1109/IRPS.2013.6531957