Automated design-for-test for 2.5D and 3D SICs

Marinissen, Erik JanErik JanMarinissenKonijnenburg, MarioMarioKonijnenburgDeutsch, SergejSergejDeutschKeller, BrionBrionKellerChickermane, VivekVivekChickermaneMukherjee, SubhasishSubhasishMukherjeeGoel, Sandeep K.Sandeep K.Goel2021-10-192021-10-192011-091526-1344https://imec-publications.be/handle/20.500.12860/19389Automated design-for-test for 2.5D and 3D SICsJournal articlehttp://www.chipscalereview.com/issues/0911/