The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images

Fatermans, J.J.Fatermansden dekker, Arnold JanArnold Janden dekkerMüller-Caspary, K.K.Müller-CasparyLobato, I.I.LobatoVan Aert, SandraSandraVan Aert2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30694The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy imagesMeeting abstract