Real-Time MOSFET Condition Monitoring for Variable Mission Profiles With a Dual Extended Kalman Filter

Deckers, MartijnMartijnDeckersVan Cappellen, LeanderLeanderVan CappellenMoschner, JensJensMoschnerDaenen, MichaëlMichaëlDaenenDriesen, JohanJohanDriesen2024-12-312024-12-312025-JAN0885-8993WOS:001367160400002https://imec-publications.be/handle/20.500.12860/45028Real-Time MOSFET Condition Monitoring for Variable Mission Profiles With a Dual Extended Kalman FilterJournal article10.1109/TPEL.2024.3480704WOS:001367160400002POWERTEMPERATUREFAILUREMODULES