Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2

Leonhardt, AlessandraAlessandraLeonhardtLockhart de la Rosa, Cesar JavierCesar JavierLockhart de la RosaNuytten, ThomasThomasNuyttenBanszerus, LucaLucaBanszerusSergeant, StefanieStefanieSergeantKoladi Mootheri, VivekVivekKoladi MootheriTaniguchi, TakashiTakashiTaniguchiWatanabe, KenjiKenjiWatanabeStampfer, ChristophChristophStampferHuyghebaert, CedricCedricHuyghebaertDe Gendt, StefanStefanDe Gendt2021-10-282021-10-2820202196-7350https://imec-publications.be/handle/20.500.12860/35456Use of the indirect photoluminescence peak as an optical probe of interface defectivity in MoS2Journal articlehttps://doi.org/10.1002/admi.202000413