Rzepa, GerhardGerhardRzepaGoes, WolfgangWolfgangGoesKaczer, BenBenKaczerGrasser, TiborTiborGrasser2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25848Characterization and modeling of reliability issues in nanoscale devicesProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7169179