Microwave characterization of Ba-substituted PZT and ZnO thin films

Tierno, DavideDavideTiernoDekkers, MatthijnMatthijnDekkersWittendorp, PaulPaulWittendorpSun, XiaoXiaoSunBayer, Samuel C.Samuel C.BayerKing, Seth T.Seth T.KingVan Elshocht, SvenSvenVan ElshochtHeyns, MarcMarcHeynsRadu, IulianaIulianaRaduAdelmann, ChristophChristophAdelmann2021-10-262021-10-2620180885-3010https://imec-publications.be/handle/20.500.12860/31947Microwave characterization of Ba-substituted PZT and ZnO thin filmsJournal articlehttps://doi.org/10.1109/TUFFC.2018.2812424