Degraeve, RobinRobinDegraeveKaczer, BenBenKaczerHoussa, MichelMichelHoussaGroeseneken, GuidoGuidoGroesenekenHeyns, MarcMarcHeynsJeon, J. S.J. S.JeonHalliyal, A.A.Halliyal2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3396Analysis of high voltage TDDB measurements on Ta2O5/SiO2 stackProceedings paper