Hot topics in IC and electronic system testing

Marinissen, Erik JanErik JanMarinissenGielen, GeorgesGeorgesGielenStucchi, MicheleMicheleStucchiV "at "ajelu, Elena-IoanaElena-IoanaV "at "ajelu2021-10-312021-10-312021-051879-6443https://imec-publications.be/handle/20.500.12860/36951Hot topics in IC and electronic system testing – from all anglesJournal articlehttps://bits-chips.nl/artikel/hot-topics-in-ic-and-electronic-system-testing-from-all-angles/