Sikula, J.J.SikulaSikulova, M.M.SikulovaVasina, PetrPetrVasinaClaeys, C.C.ClaeysSimoen, EddyEddySimoen2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/865Models for Burst and RTS Noise Mechanism in Electronic DevicesOral presentation