Moschalkov, V. V.V. V.MoschalkovGielen, L.L.GielenStrunk, C.C.StrunkJonckheere, RikRikJonckheereQiu, Xing ZhiXing ZhiQiuVan Haesendonck, ChrisChrisVan HaesendonckBruynseraede, Y.Y.Bruynseraede2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/268Effect of the Sample Topology on Superconducting Critical ParametersJournal article