Makarov, A.A.MakarovTyaginov, S. E.S. E.TyaginovKaczer, BenBenKaczerJech, M.M.JechVaisman Chasin, AdrianAdrianVaisman ChasinGrill, A.A.GrillHellings, GeertGeertHellingsVexler, M. I.M. I.VexlerLinten, DimitriDimitriLintenGrasser, T.T.Grasser2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28894Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topologyProceedings paperhttp://ieeexplore.ieee.org/document/8268381/