Degraeve, RobinRobinDegraeveCrupi, FeliceFeliceCrupiHoussa, MichelMichelHoussaKwak, Dong HwaDong HwaKwakKerber, AndreasAndreasKerberCartier, EduardEduardCartierKauerauf, ThomasThomasKaueraufRoussel, PhilippePhilippeRousselAutran, Jean-LucJean-LucAutranPourtois, GeoffreyGeoffreyPourtoisPantisano, LuigiLuigiPantisanoDe Gendt, StefanStefanDe GendtHeyns, MarcMarcHeynsGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152004-09https://imec-publications.be/handle/20.500.12860/8818Reliability issues in high-k stacksProceedings paper