Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability

Agbo, InnocentInnocentAgboTaouil, MottaqiallahMottaqiallahTaouilHamdioui, SaidSaidHamdiouiWeckx, PieterPieterWeckxCosemans, StefanStefanCosemansRaghavan, PraveenPraveenRaghavanCatthoor, FranckyFranckyCatthoorDehaene, WimWimDehaene2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26275Quantification of sense amplifier offset voltage degradation due to zero-and run-time variabilityProceedings paperhttp://ieeexplore.ieee.org/document/7560287/